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blog:2020-03-10_microsemi_flashpro_exit_codes
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2020-03-10 Microsemi FlashPro Exit Codes
- Refer the Microsemi FlashPro user guide.
- I memo the exit codes here for the easy check while in development.
- SmartFusion, IGLOO, ProASIC3 and Fusion Device Exit Codes for Software v8.6+
SmartFusion, IGLOO, ProASIC3 and Fusion Device Exit Codes for Software v8.6+
| ERROR CODE | Exit Code | Exit Message | Possible Cause | Possible Solution |
|---|---|---|---|---|
| 0 | Passed (no error) | |||
| 1 | A physical chain does not match the expected set up from the STAPL file. Also known as Checking Chain Error. | Physical chain configuration has been altered. Something has become disconnected in the chain. The specific IR length of nonMicrosemi devices may be incorrect. The order of the specified chain may be incorrect. | ||
| 0x8052 | 5 | Failed to enter programming mode. | Unstable VPUMP voltage level. Unstable VCC Signal integrity issues on JTAG pins. Device is in FlashFreeze mode (ProASICL or IGLOO devices) Older software or programming file used. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. Disble the FlashFreeze pin (ProASICL or IGLOO devices) Generate STAPL file with the latest version of Designer/FlashPro. Use latest version of FlashPro software. |
| 0x801D 0x8053 | 6 | Failed to verify IDCODE | Incorrect programming file Incorrect device in chain Signal integrity issues on JTAG pins | Choose the correct programming file and select the correct device in chain. Measure JTAG pins and noise or reflection. If TRST is left floating then add pull-up to pin. Reduce the length of ground connection. |
| 0x8005 0x8009 0x800B | 6 | Failed to verify AES Sec. | Programming file generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro. Use latest version of FlashPro software. Try again at a slower TCK. Contact Microsemi Technical Support. |
| 0x8008 | 6 | Failed to verify IDCODE. Target is an M7 device | File is not for M7, but target device is M7 Signal integrity issues on JTAG pins. | Check that the target device is M7 enabled. Make sure that the programming file you generated is for an M7-enabled device. Measure JTAG pins, noise and reflection. |
| 0x800A | 6 | Failed to verify IDCODE Target is an M1 device | Files not for M1, but target device is M1. Signal integrity issues on JTAG pins | Check that the target device is M1 enabled. Make sure the programming file generated is for an M1-enabled device. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x800C | 6 | Failed to verify IDCODE. Core enabled device detected | File is not for target device. Signal integrity issues on JTAG pins | Check the target device; make sure the programming file generated is matches the target device. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x800D | 6 | Failed to verify IDCODE. The target is not M7 device | File is for M7 but target device is not M7. Signal integrity issues on JTAG pins. | Check that the target device is not M7 enabled. Make sure that the programming file generated is for non-M7 enabled device. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x800E | 6 | Failed to verify IDCODE. Target is not an M1 device | File is for M1, but target device is not M1. Signal integrity issues on JTAG pins | Check that the target device is not M1 enabled. Make sure that the generated programming file is for non-M1 enabled device. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8006 | 6 | Failed to verify IDCODE. Target is not a P1 device File is not for P1, but target device is a P1 device.Z Signal integrity issues on JTAG pins | Check that the target device is P1 enabled. Make sure programming file generated is for M1 enabled device. Monitor VJTAG during programming;measure JTAG signals for noise or reflection. | |
| 0x801E | 6 | A3PE600 Engineering Sample Device Detected. | This device is supported with pre-v8.3 SP1 STAPL files only Contact Microsemi Technical Support | |
| 0x8057 | 8 | Failed Erase Operation. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8058 | 10 | Failed to program FPGA array at row <row number>. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x805D 0x805E 0x807B | 10 | Failed to enable FPGA Array | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8095 0x8096 0x8097 | 10 | Failed to disable FPGA Array. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming;measure JTAG signals for noise or reflection. |
| 0x8061 0x8062 | 10 | Failed to program FlashROM. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x801B 0x801C 0x806C 0x806D 0x806E | 10 | Error programming Embedded Flash Memory Block (EFMB) | Unstable VCC_NVM/VCC_OSC voltage level (Fusion only) Unstable VCC_ENVM/VCC_RCOSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins | NVM corruption is possible when writing from your design; check the NVM status for confirmation. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. Reset signal is not properly tied off in your design. Inspect device using Device Debug. |
| 0x807D 0x807E | 10 | Error programming system init and boot clients | Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. Inspect device using Device Debug. |
| 0x8069 0x806A 0x806B | 10 | Error programming Embedded Flash Memory Block (EMFB) | Programming file generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software Try again at a slower TCK Inspect device using Device Debug. Contact Microsemi Technical Support |
| 0x808E 0x808F 0x8090 0x8091 | 10 | Error programming Embedded Flash Memory Block (EFMB) | Try reprogramming Contact Microsemi Technical Support |
|
| 0x807F 0x8080 | 10 | Error programming system init and boot clients | Programming file generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software Try again at a slower TCK Inspect device using Device Debug. Contact Microsemi Technical Support |
| 0x8059 0x805B | 11 | Verify 0 failed at row <row number> Verify 1 failed at row <row number>. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8060 | 11 | Failed to verify FlashROM at row <FlashROM row number>. | Device is programmed with a different design. Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Run VERIFY_DEVICE_INFO to verify the device is programmed with the correct data/design. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8075 0x8076 0x8077 | 11 | Failed to verify Embedded Flash Memory Block (EFMB) | Device is programmed with a different design. Unstable VCC Unstable VCC_NVM/VCC_OSC (Fusion only) Unstable VCC_ENVM/VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. The EFMB data was modified in your FPGA design after programming. This could have occurred during standalone verify. The target EFMB is locked with FlashLock when running ACTION PROGRAM_NVM_ACTIVE_ARRAY or VERIFY_NVM_ACTIVE_ARRAY. | Verify the device is programmed with the correct data/design. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Measure JTAG pins, and noise or reflection. Run DEVICE_INFO to confirm if the target EFMB block is locked with FlashLock (pass key). If the target EFMB block is locked, then you must unlock it by erasing the security and then reprogramming with the desired security settings. After unlocking the target EFMB block attempt to rerun the target ACTION. Inspect device using Device Debug. |
| 0x8085 0x8086 | 11 | Failed to verify system init and boot clients | Device is programmed with a different design. Unstable VCC Unstable VCC_NVM/VCC_OSC (Fusion only) Unstable VCC_ENVM/VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. The EFMB data was modified in your FPGA design after programming. This could have occurred during standalone verify. The target EFMB is locked with FlashLock when running ACTION PROGRAM_NVM_ACTIVE_ARRAY or VERIFY_NVM_ACTIVE_ARRAY. | Verify the device is programmed with the correct data/design. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Measure JTAG pins, and noise or reflection. Run DEVICE_INFO to confirm if the target EFMB block is locked with FlashLock (pass key). If the target EFMB block is locked, then you must unlock it by erasing the security and then reprogramming with the desired security settings. After unlocking the target EFMB block attempt to rerun the target ACTION. Inspect device using Device Debug. |
| 0x8072 0x8073 0x8074 | 11 | Failed to verify Embedded Flash Memory Block (EFMB) | Programming file generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software Try again at a slower TCK Inspect device using Device Debug. Contact Microsemi Technical Support |
| 0x8083 0x8084 | 11 | Failed to verify system init and boot clients | Programming file generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software Try again at a slower TCK Inspect device using Device Debug. Contact Microsemi Technical Support |
| 0x8014 0x8015 | 11 | Failed to verify calibration data | Unstable VCC Unstable VCC_NVM/VCC_OSC (Fusion only) Unstable VCC_ENVM/VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. Try reprogramming. Workaround: Disable optional procedure CHECK_AND_BACKUP_CALIB |
| 0x805A 0x805C | 11 | Verify 0 failed at row <row number>. Verify 1 failed at row <row number> | Device is programmed with a different design Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins | Run VERIFY_DEVICE_INFO to verify the device is programmed with the correct data/design. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming measure JTAG signals for noise or reflection. |
| 0x8063 | 14 | Failed to program Silicon Signature. Failed to program security lock settings. | Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8068 | -18 | Failed to authenticate the encrypted data. | Incorrect AES key. Signal integrity issues on JTAG pins. | Generate a programming file with the correct AES key. Monitor VJTAG during programming;measure JTAG signals for noise or reflection. |
| 0x805F | -20 | Failed to verify FlashROM at row <FlashROM row number>. | Programming file generated with an older version of software Device is programmed with a different design. Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software. Program with the correct data/design. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Measure JTAG pins and noise or reflection. |
| 0x8065 | -22 | Failed to program pass key. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8066 | -23 | Failed to program AES key. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Measure JTAG pins and noise or reflection. |
| 0x8055 0x8056 | -24 | Failed to program UROW. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. Make sure you mounted 0.01µF and 0.33µF caps on Vpump (close to the pin). |
| 0x802A | -27 | FlashROM Write/Erase is protected by the passkey. A valid passkey needs to be provided. | File contains no passkey and device is secured with a passkey. Passkey in the file does not match device. | Provide a programming file with a passkey that matches the passkey programmed into the device. |
| 0x8025 | -28 | FPGA Array Write/Erase is protected by the passkey. A valid pass key needs to be provided. | File contains no passkey and device is secured with a passkey. Passkey in the file does not match device. | Provide a programming file with a passkey that matches the passkey programmed into the device. |
| 0x802B 0x802D | -29 | FlashROM Read is protected by passkey. A valid passkey needs to be provided. | File contains no passkey and device is secured with a passkey. Passkey in the file does not match device. | Provide a programming file with a pass key that matches the passkey programmed into the device |
| 0x8024 0x8026 | -30 | FPGA Array verification is protected by a passkey. A valid passkey needs to be provided. | File contains no passkey and device is secured with a passkey. Passkey in the file does not match device. Provide a programming file with a passkey that matches the passkey programmed into the device. | |
| 0x804B 0x8001 0x8007 | -31 | Failed to verify AES key. | AES key in the file does not match the device. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Unstable JTAG/VPUMP voltage level. | Provide a programming file with an AES key that matches the AES key programmed into the device. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x8000 | -31 | Failed to verify AES key. | Programming file generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software. Try again at a slower TCK Contact Microsemi Technical Support |
| 0x8020 0x8022 0x8028 | -33 | FPGA Array encryption is enforced. A programming file with encrypted FPGA array data needs to be provided. | File contains unencrypted array data, but device contains AES key. | Provide a programming file with an encrypted FPGA Array data. |
| 0x802C 0x802F | -34 | FlashROM encryption is enforced. A programming file with encrypted FlashROM data needs to be provided. | File contains unencrypted FlashROM data, but the device contains an AES key. | Provide a programming file with an encrypted FlashROM data. |
| 0x801F 0x804A | -35 | Failed to match pass key. | Pass key in file does not match pass key in device. | Provide a programming file with a pass key that matches the pass key programmed into the device. |
| 0x802E 0x8030 | -36 | FlashROM Encryption is not enforced. Cannot guarantee valid AES key present in target device. Unable to proceed with Encrypted FlashROM programming. | File contains encrypted FlashROM, but device encryption is not enforced for FlashROM | Regenerate security programming file with proper AES key. Program device security. Retry programming FlashROM with encrypted programming file. |
| 0x8021 0x8023 0x8027 0x8029 | -37 | FPGA Array Encryption is not enforced. Cannot guarantee valid AES key present in target device. Unable to proceed with Encrypted FPGA Array verification. | File contains encrypted FPGA Array, but the device encryption is not enforced for FPGA Array. | Regenerate security programming file with proper AES key. Program device security. Retry programming FPGA Array with encrypted programming file. |
| 0x8067 | -38 | Failed to program pass key. | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins. Bad device. | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Measure JTAG pins and noise or reflection. |
| 0x806F 0x8070 0x8071 0x8081 0x8082 0x8089 | -39 | ERROR: 2 or more errors found on this page | Unstable VCC_NVM/VCC_OSC voltage (Fusion only) Unstable VCC_ENVM/VCC_ROSC (SmartFusion only) NVM reset signal is floating in user design 2 or more ECC errors found when reading the eNVM | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Bias NVM reset to a logic state in user design. Try reprogramming. |
| 0x8010 | -39 | ERROR: 2 or more errors found on this page. | 2 or more ECC errors found when reading the master calibration data | The master calibration data has been corrupted. Try restoring master calibration from backup, if it exists, by running RECOVER_CALIB. Workaround: Disable optional procedure CHECK_AND_BACKUP_CALIB |
| 0x8013 | -39 | ERROR: 2 or more errors found on this page. | 2 or more ECC errors found when verifying the backup calibration | Rerun action to attempt to write backup calibration again. Workaround: Disable optional procedure CHECK_AND_BACKUP_CALIB |
| 0x8078 0x8079 0x807A 0x8087 0x8088 | -40 | Embedded Flash Memory Block MAC Failure. | Data in the file is encrypted with a different AES key than the device. | Verify the programming file is generated from the latest version of Designer/FlashPro. |
| 0x8002 0x8003 | -42 | Failed to verify security settings. | File security settings do not match device. | Provide a programming file with security setting that match the security settings programmed into the device. |
| 0x8093 | -42 | Failed to verify eNVM/EFMB client JTAG protection settings | Device eNVM/EFMB client JTAG protection settings are not programmed or are programmed with different settings | Verify the device is programmed with the correct eNVM/EFMB client JTAG protection settings |
| 0x8004 | -43 | Failed to verify design information. | File checksum and design name do not match the device. | Verify the device is programmed with the correct data and design. |
| 0x8049 | -44 | Failed to verify AES key. | The AES key in the file does not match the AES key in the device. File does not contain an AES key and the device is secured with an AES key. | Provide a programming file with an AES key that matches the AES key programmed into the device. |
| 0x8054 | -45 | Device package does not match the programming file. | Programming file was generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software. |
| 0x8033 0x8038 0x803D 0x8042 0x8045 0x8046 0x8047 0x8048 | -46 | Embedded Flash Memory Block X Read is protected by pass key. A valid pass key needs to be provided. | File contains no pass key or incorrect pass key but EFMB read is secured with a pass key. | Provide a programming file with the correct pass key. |
| 0x8034 0x8039 0x803E 0x8043 | -46 | Embedded Flash Memory Block (EFMB) block X Read is not protected by pass key. EFMB content is not secure after encrypted programming. Unable to proceed with encrypted NVM programming. | File contains encrypted EFMB for block X but the device encryption is not enforced for EFMB block X. | Regenerate security programming file with the proper AES key. Program device security. Retry programming with EFMB block X with encrypted programming file. |
| 0x8032 0x8037 0x803C 0x8041 | -47 | Embedded Flash Memory Block (EFMB) block X encryption is enforced. A programming file with encrypted EFMB data needs to be provided. | The programming EFMB data is not encrypted, but the device contains an AES key with encryption enforced. | Provide a programming file with encrypted EFMB data. |
| 0x8031 0x8036 0x803B 0x8040 | -48 | Embedded Flash Memory Block (EFMB) block X Write is protected by pass key. A valid pass key needs to be provided. | File contains no pass key or incorrect pass key, but device is secured with a pass key. | Provide a programming file with a passkey that matches the passkey programmed into the device. |
| 0x8035 0x803A 0x803F 0x8044 | -49 | Embedded Flash Memory Block (EFMB) block X Encryption is not enforced. Cannot guarantee valid AES key present in target device. Unable to proceed with Encrypted EFMB programming. | File contains encrypted EFMB for block X, but the device encryption is not enforced for EFMB block X. | Regenerate security programming file with proper AES key. Program device security. Retry programming EFMB block X with encrypted programming file. |
| 0x801A | -50 | No backup calibration data found or backup calibration data has been corrupted | No backup calibration copy has been made or the backup copy has been corrupted | If master copy is still intact, rerun Action to create backup calibration copy. Workaround: Disable optional procedure CHECK_AND_BACKUP_CALIB |
| 0x804E | -51 | Failed to access Embedded Flash Memory. (AFS600 only) | This version of the silicon does not support programming of the Embedded Flash Memory Block while the FPGA Array is active. | If programming the EFMB while the FPGA is active is not required, then use actions PROGRAM_NVM or VERIFY_NVM. Otherwise, use latest revision of silicon. |
| 0x804F | -52 | Failed to access Embedded Flash Memory. (AFS1500 only) | This version of the silicon does not support programming of the Embedded Flash Memory Block while the FPGA Array is active. | If programming the EFMB while the FPGA is active is not required, then use actions PROGRAM_NVM or VERIFY_NVM. Otherwise, use latest revision of silicon. |
| 0x8050 | -53 | Failed to access Embedded Flash Memory. (AFS1500 only) | This version of the silicon does not support programming block 3 of the EFMBs while the FPGA Array is active. | If programming the EFMB while the FPGA is active is not required, then use actions PROGRAM_NVM or VERIFY_NVM. Otherwise, use EFMB blocks 0, 1, or 2, but do not use block 3. |
| 0x8051 | -54 | Failed to access Embedded Flash Memory. | FPGA Array is accessing the target EFMB block while attempting programming. NVM reset signal is stuck in design. Unstable VCC MSS Clock is disabled during programming. MSS Clock is not properly routed to the correct pin. | If programming the EFMB while the FPGA is active is not required, then use actions PROGRAM_NVM or VERIFY_NVM. Otherwise, check the FPGA design or use a different EFMB block that is not being accessed. Check if target EFMB block logic is tied to reset. Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Verify that the NVM reset signal in the design is not stuck. Verify the MSS clock is enabled during programming. If the MSS clock is defined as an external I/O, then verify that it is properly routed to the correct pin. |
| 0x808A 0x8094 | -55 | Failed to read Embedded Flash Memory Block (EFMB) | Programming file generated with an older version of software | Generate STAPL file with the latest version of Designer/FlashPro; use the latest version of FlashPro software Try again at a slower TCK Inspect device using Device Debug Contact Microsemi Technical Support |
| 0x808B | -55 | Failed to read Embedded Flash Memory Block (EFMB) | Unstable VPUMP voltage level. Unstable VCC Unstable VCC_OSC (Fusion only) Unstable VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Monitor VJTAG during programming; measure JTAG signals for noise or reflection. |
| 0x808C | -55 | Failed to read Embedded Flash Memory Block (EFMB) | Internal error | Contact Microsemi Technical Support |
| 0x8011 | -56 | Failed to read calibration data | Try reprogramming. Workaround: Disable optional procedure CHECK_AND_BACKUP_CALIB |
|
| 0x8012 | -56 | Failed to read calibration data | Unstable VCC Unstable VCC_NVM/VCC_OSC (Fusion only) Unstable VCC_ENVM/VCC_ROSC voltage level (SmartFusion only) Signal integrity issues on JTAG pins | Monitor related power supplies that cause the issue during programming; check for transients outside of Microsemi specifications. See your device datasheet for more information on transient specifications. Measure JTAG voltages, noise, and reflection. Try reprogramming. Workaround: Disable optional backup procedure CHECK_BACKUP_CALIB |
| 0x808D 0x8092 | -57 | eNVM/EFMB is protected by a Pass Key; you must provide a valid Pass Key | File contains no Pass Key and device is secured with a Pass Key Pass Key in the file does not match device | Provide a programming file with a Pass Key that matches the Pass Key programmed into the device |
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Permalink blog/2020-03-10_microsemi_flashpro_exit_codes.txt · Last modified: 2020/03/17 11:01 by jethro
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